Towards Understanding the Sensitivity of the Reliability Achievable by Simplex and Replicated Star Topologies in CAN

Proceedings of the 16th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2011), Toulouse, France

Authors: Manuel Alejandro Barranco González; Julián Proenza Arenas.
Category: Conferences Publication Date: September, 2011 Citekey: BP2011
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