Combination of Weak Classifiers for Metallic Corrosion Detection and Guided Crack Location

Proceedings of the XV IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)

Authors: Francisco Bonnín Pascual; Alberto Ortiz Rodriguez.
Category: Conferences Publication Date: December, 2010 Citekey: bonnin-pascual-etfa2010 Location: Bilbao (Spain)
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